胡贵军

   

   姓    名
胡贵军
性别
男
职    称
副教授




专业：
通信与信息系统
研究方向
光纤通信与光电子技术


研究方向

简述
1.研究全光通信网的关键技术，包括DWDM技术，全光再生技术，IP over WDM技术等。
2.研究光通信器件的光电特性，包括器件特性测试，可靠性评价以及新型检测技术等。

科研成果（近三年发表的重要论文、科研获奖情况等）：

近三年发表第一作者论文近20篇，其中SCI检索5篇，EI检索3篇。目前，主持和参加科研项目4项。

代表性论文有：

1. H. Guijun, S. Jiawei et al. Noise as reliability screening for semiconductor lasers.

Applied Physics B, 2003, 76(4):359-363 SCI检索

2. Hu Guijun, Shi Jiawei, Qi Liyun et al. High-power quantum well remote junction laser and its electrical noise characteristics. Optical & Laser Technology, 2001, 33(4):231-236 SCI检索

3. Hu Guijun, Shi Jiawei, Zhang Sumei et al. Correlation between the low- frequency electrical noise of high-power quantum well lasers and devices surface non-radiative current.

Microelectronics Reliability. 42(1),2002,153-156 SCI检索

4. Hu Guijun, Shi Jiawei, Zhang Sumei et al. Low-frequency electrical noise as reliability estimation for high-power semiconductor lasers. Optical and Quantum electronics, 2002, 34(10):987-992 SCI检索

5. Hu Guijun, Shi Jiawei, Shi Yingxue et al. An improved method and experimental results of noise used as reliability estimation for semiconductor lasers.

Optical & Laser Technology, 2003, 35(6):481-483 SCI检索

6. Hu Guijun, Shi Jiawei, Zhang Sumei et al. Correlation between the low-frequency electrical noise of high-power quantum well lasers and devices quality. Proceedings of SPIE , 2000, 4220:217-220 EI检索

7. Hu Guijun, Shi Jiawei, Zhang Sumei et al. The low-frequency terminal electrical noise of high power quantum well lasers and facet stability. Proceedings of SPIE, 2001, 4602:32-35 EI检索

8. Hu Guijun, Shi Jiawei, Zhang Sumei et al. The electrical noise used to estimate the reliability of high power semiconductor lasers.

Proceedings of SPIE, 2001,4580: 482-485 EI检索

9．胡贵军，张亮等，基于光纤光栅的高功率光纤激光器。光子学报，已接收。

10．胡贵军，张亮等，高功率掺Yb3+双包层光纤激光器阈值特性研究。中国激光，已接收。